1. Material development:
- Indigenously developed Czochralski puller
- Indigenously developed automatic diameter control (ADC) system
- Cyberstar ADC pull-head for crystal growth coupled to resistive heated furnace (high gradient and low gradient)
- Optical floating zone crystal growth work station (CSC, Japan)
- Box and muffle furnaces for the synthesis and sintering of materials
- A tungsten heater vacuum furnace up to 1800 oC
- Inert atmosphere furnaces & Vacuum ovens.
2. Material characterization:
- Physisorption for BET surface area measurement & chemisorption system.
- Field Emission Scanning Electron Microscope (FESEM).
- Potentiostat for electrochemical studies.
- Atomic force microscope.
- D/H Mass spectrometer.
- Refractive index measurement system (Metricon, Prism Coupler-based)
- Differential scanning calorimetry (Rigaku)
- Thermoluminescence (Nucleonix)
- Impedance analyzer (HP4194A Hewlett Packard, USA and Nova control, France) for dielectric and impedance studies in the temperature range (150-800 K) and frequency range 1mHz to 40MHz .
- Powder X-ray diffractometer (18kW and 3kW, Rigaku, Japan)
- Hystersis loop tracer (Radiant, USA) for Polarization vs. Electric Field and Strain vs Electric Field measurements.
- Polarizing Light Microscope (BX60, Olympus, Japan) equipped with hot-stage (Linkam).
- Thickness measurement unit (Filmatrics, USA.)
- Viscometer.
- Inductive coupled Plasma (ICP-OES) for trace element detection.
3. Material processing:
- String-type cutter (South Bay Tech.)
- High energy ball mill (Fritsch, Germany)
- Hot-press (Therlek, India) for sintering (Tmax=1250 oC) of ceramic samples under load (Max. 5 Tons).
- Cold Isostatic Press (CIP) up to 3000 bar
- Dilatometer (Linseis, Germany) up to 1900 oC in Ar-atmosphere and up to 1650 oC in air.
|
