| Optical Coatings Laboratory |
Optics characterization facility:
Accurate characterisation of coatings developed are very important prior to their use in lasers and other spectroscopic experiments. Our characterization laboratory consists of i) two spectrophotometers for determination of specular transmission, reflection and their diffused components as well in the range 190 to 3000 nm., ii) variable angle spectroscopic ellipsometer for determination of film thickness and optical constants, iii) atomic force microscope for characterisation of surface morphology, iv) laser damage threshold measurement using Nd:YAG and it’s 2nd harmonic wavelengths (5 nsec, 1 J @ 1064 nm, 0.5 J @ 532 nm,10 Hz) and v) photo-thermal common path interferometer to measure ultra low absorption (532 nm) in optical coatings.
Spectrophotometer |
Spectroscopic Ellipsometer |
Atomic force microscope |
Laser induced damage threshold measurement setup |
Photo- Thermal common path interferometer |
Scattering measurement setup |
List of machines available at ODDL and technical details:
Sl. No |
Machine and brief description |
1 |
Ion-assisted electron beam deposition system for hard dielectric multilayer coating on 75 mm dia. (4 nos.), 50 mm dia. (4 nos.) and 25 mm dia (8 nos.) |
2 |
Dual ion beam sputter deposition system for high damage threshold multilayer dielectric coating on 150 mm dia. (4 nos.) |
3 |
Magnetron sputtering system for metallic multilayer coating on 150 x 150 mm substrate. |
4 |
Spin coating facility on 50 mm dia. substrates |
Precision characterization Instruments available:
Sl.No |
Instrument |
Technical details |
1 |
CARY 5000 Spectrophotometer |
Can measure transmission, reflection, diffused transmission and reflection at variable angle of incidence in the range 190- 2500 nm on 100 mm dia. optics |
2 |
CARY 50 spectrophotometer |
Can measure transmission on 100 mm dia optics in the range 190 - 1100 nm |
3 |
Variable angle spectroscopic ellipsometer |
Can measure refractive index and extinction coefficient of transparent thin films samples in the range 250-1700 nm using monochromator and 250-1000 nm using CCD. |
4 |
Atomic force microscope |
Can measure surface morphology of optics and coatings in the nm range. |
5 |
Photo thermal common path interferometer |
Can measure ultra low absorption at 532 nm in the ppm range of dielectric thin film coatings and optics. |
6 |
Laser damage threshold measurement setup |
Can measure damage threshold in the range 0.2 - 35 J/cm2 @ 6 ns for 1064 nm and 532 nm laser. |
7 |
Scattering measurement setup |
Can measure very low scattering in the ppm range of optics and coatings at 633 nm. |
8 |
Optical Microscope |
Differential interference contrast microscope with 5x to 100x magnification. |
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