This beamline utilizes X-ray diffraction (XRD) technique in energy-dispersive and angle-dispersive modes to carry out experiments mainly focused on engineering problems, viz; stress measurement, texture measurement, micro structure and elastic constants determination in variety of bulk as well as thinfilm samples. The flexible design of beamline allows various types of X-ray scattering experiments such as grazing angle diffraction, X-ray reflectivity and energy dispersive XRD. Additionally, the beamline has insitu high temperature (up to 900 K) facility with vacuum (better than 5×10-5 mbar) environment. The facility for insitu XRD during mechanical loading will be added soon.
This beamline enables a wide range of experiments:
Residual stress measurements in thinfilms and bulk samples
Powder diffraction, line profile analysis
Energy dispersive XRD
X-ray reflectivity, Resonant X-ray reflectivity
High resolution XRD for epitaxial thin films
High temperature (Room Temperature to ~900 K) and Low Temperature XRD measurements down to ~100 K
Schematic layout of the engineering application beamline (not to the scale)
Experimental station
A high-precision open Eulerian cradle six-circle Huber diffractometer :
Can accommodate a sample up to ~15 kg weight, has sphere of confusion of 50 μm for all axis movement.
Can handle a sample size up to: 1000 mm (L), 500 mm (W) and 45 mm thickness.
Allows a high 2θ range up to 170 deg. with a step size accuracy of 0.0002 deg.
Available Detectors
2D PSD with ~6 deg coverage and pixel size of~0.016 deg
1D PSD with ~3.5 deg coverage and pixel size of ~0.003 deg
Energy range 5 -35 keV
Resolution 122 eV FWHM at 5.9 keV,
Count rates > 1,000,000 CPS
Energy range 5 -300 keV
Resolution 550 eV FWHM at 122 keV,
Count rates > 50,000 CPS
Heating-cooling stages
A high temperature stage (reflection geometry) for insitu XRD experiments from RT to ~900 K under high vacuum atmosphere (better than 5×10-5 mbar) , temperature stability ~0.5 K and 2θ range up to 100 deg.
Linkam stage (transmission geometry)
temperature range from 77 K to 873 K
high heating rate upto 150 K/min
2θ range of ~40 deg.
1.
BL-02: a versatile X-ray scattering and diffraction beamline for engineering applications at Indus-2 synchrotron source Pooja Gupta, PN Rao, MK Swami, A Bhakar, Sohan Lal, SR Garg, CK Garg, PK Gauttam, SR Kane, VK Raghuwanshi, SK Rai,
Journal of Synchrotron Radiation 28 (4), 1193-1201, 2021
2.
Line profile analysis of synchrotron X-ray diffraction data of iron powder with bimodal microstructural profile parameters A Bhakar, P Gupta, PN Rao, MK Swami, P Tiwari, T Ganguli, SK Rai ,
Journal of Applied Crystallography 54 (2), 498-512, 2021
Team members
Dr. S.K. Rai (sanjayrai@rrcat.gov.in)
Dr. Mahesh Kumar Swami
Dr. Pooja Gupta
Dr. Nageswrarao Pothanna
Mr. Ashok Bhakar
Science Highlights
1. Residual stress measurement on inside wall of roll bonded Zircaloy SS pressure tubes used in PHWRs. These samples had diameter of 150 mm, length 200 mm and weight of 12 kg.
Stress profile on the inside surface
Photograph of the sample
This work was done in collaboration with RED, BARC.
2. Microstructure assessment of Fe powder using line profile analysis
The super-Lorentzian peak shapes of XRD data of Fe were modeled using convolution of bimodal microstructural parameters. The dislocation densities estimated for narrow and broad profile were about 2×1014 and 2×1015 m-2.
Profile fitting of a 200 Bragg peak using convolution of bimodal microstructure.
Comparison of deconvoluted narrow and broad profiles of Bragg peaks of Fe powder using WH plot.
3. Depth dependent stress profile on laser shock peened Ni based super-alloys for aerospace applications
Stress profile on sample peened with tape
Stress profile on sample peened without tape
Depth profiling was done by sequential electro-polishing on the alloy samples. These results were matched well with FEM simulations. This work was done in collaboration with Materials Science Engineering department of IIT Delhi.
